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Ionic Contamination Test, Solderability Test, SIR & CAF, Optical Inspection, SMT Stencil Cleaning

Surface Insulation Resistance Testing System. Measuring changes in surface insulation resistance.

The Gen3 Systems AutoSIR 2 system represents a dramatic improvement over existing SIR test alternatives, and its shielded precision electronics allows state-of-the-art accuracy resistance measurements to be made up to 1014 Ω.

One AutoSIR chassis can hold between 1 to 16 measurement cards and can monitor up to 256 x 2-point test patterns or 78 x 5-point test patterns, or 32 x 9-point test patterns at selectable intervals from minutes to days. Each channel is current limited (1 M Ω), ensuring that dendrites are preserved for failure analysis. The frequent monitoring capability provides a full picture of the electrochemical reactions taking place on a circuit assembly, and provides early trend analysis enabling tests to be curtailed, thus saving considerable test time and money.

The key features of this system are;

Measurement Time: 256 Channels <8 seconds

Applied Voltage: +1V to 1000V
Measurement Range: 106 Ω to 1014 Ω
Measurement Method: Continuous on all selected channels
Measurement Test Intervals: Fully Selectable from minimum of 1 minute