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Ionic Contamination Test, Solderability Test, SIR & CAF, Optical Inspection, SMT Stencil Cleaning
Conductive Anodic Filament Monitoring System. Measuring the influences of sub-surface electro-chemical reactions.
AutoCAF is able to measure up to 256 individual measurement sites under conditions of high humidity and temperature in accordance with IPC-TM-650 2.6.25 Test Method & IPC 9691 CAF Test Users Guide.
Conductive anodic filament (CAF) failure is copper corrosion within a printed board. It is electro-migration of the copper from Anode to Cathode between two conductors of different potential, whereas growth from Cathode to Anode is a dendrite.
A combination of bias voltage and high humidity enhance CAF failures. Electrical failure results when a filament grows between electrically isolated nets. See IPC-9691 for further information on CAF.
The NEW AutoCAF 2 was developed in conjunction with a major CAF research project conducted by the British NPL.
The key features of this system are;
Measurement Time: 256 Channels <8 seconds
Applied Voltage: +1V to 1000V
Measurement Range: 106 Ω to 1014 Ω
Measurement Method: Continuous on all selected channels
Measurement Test Intervals: Fully Selectable from minimum of 1 minute