ASCENTECH, LLC
Product Reliabiity Test Equipment
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GEN3 Systems
and
IRTS
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Electronic Assmebly
PCB Fab
Reliability Test  Eq.
Product Data
SOLDERABILITY TESTING SYSTEM /  SURFACE INSULATION RESISTANCE TESTING -SIR /  CONTAMINATION TESTING (IONIC)/ THERMAL SHOCK TEST SYSTEM
Solder Paste Analyser - SPA 1000
  Test and measurement of essential solder paste condition that, when properly controlled will:
  • Improve quality
  • Increase process yield
  • Reduce inspection and rework
       Testing to Current Standards, including:
  • IEC 61189-5 - Slump Test, Solder Ball Test, Tack Test, Wetting Test
  • IPC-TM-650 - Slump, Solder Ball, Tack, Wetting and Spread Test
Solderability Testing System - MUST III - GEN3 
    Wetting Balance Testing / Solder Bath Testing ( Including Lead-Free)
       Testing to all Current Standards, including:

  • IEC 60068-2-54 and 60068-2-69
  • MIL-STD-883 Method 2022
  • IPC/EIA J-STD-003A
  • IPC/EIA/JEDEC J-STD-002B
  • EIA/JET-7401
       Edge Dip Method Standards, including:
  • IEC 60068-2-20 and 60068-2-58
  • IPC/EIA/JEDEC J-STD-002B
  • IPC/EIA J-STD-003A
Surface Insulation Resistance Testing System - AUTO-SIR - GEN3

    Automated Precision Surface Insulation Resistance SIR Testing
            SIR Testing to all current Standards, including:
  • IEC 61189-5 (process characterisation)
  • ISO 9455-17
  • IPC-TM-650
  • BELLCORE GR-78-CORE
  • DIN GERMAN & JIS JAPANESE Standards
            Auto- SIR Testing includes elements of:
  • ANSI/IPC-JSTD001C (assembly requirements)
  • IPC-JSTD-004 (solder flux characterisation)
  • IPC-SM-840 (solder mask)
  • IPC-CC-830 & IEC 1086 (conformal coatings)
Cleanliness Testing Systems - CM11 and CM 12 - GEN3

    Contaminometer  - Precision Cleanliness Test
            ROSE - SEC Testing to current Standards, including:
  • IEC
  • ISO
  • IPC
  • ANSI
  • JIS
Thermal Shock Test Systems - Integrated Reliability Test Systems (IRTS)
  • Providing accelerated thermal shock test systems and services to the PC board and electronic interconnect industries
  • Highly Accelerated Thermal Shock (HATS) Test System
  • -60c to =160c
  • Transition time: 30seconds (-60c to =160c)
  • Data acquisition using 4-wire resistance measurement with accuracy of 2% of value
  • IPC PCQR/2  /  D-36 committee adopted HATS test method to collect relative reliability data