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ASCENTECH, LLC
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Product Reliabiity Test Equipment
From
GEN3 Systems
and
IRTS
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SOLDERABILITY TESTING SYSTEM
/ SURFACE INSULATION RESISTANCE TESTING -SIR /
CONTAMINATION TESTING (IONIC)/ THERMAL SHOCK TEST SYSTEM
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Solder Paste Analyser - SPA 1000 Test and measurement of essential solder paste condition that, when properly controlled will:
- Improve quality
- Increase process yield
- Reduce inspection and rework
Testing to Current Standards, including:
- IEC 61189-5 - Slump Test, Solder Ball Test, Tack Test, Wetting Test
- IPC-TM-650 - Slump, Solder Ball, Tack, Wetting and Spread Test
Solderability Testing System - MUST III - GEN3
Wetting Balance Testing / Solder Bath Testing ( Including Lead-Free)
Testing to all Current Standards, including:
- IEC 60068-2-54 and 60068-2-69
- MIL-STD-883 Method 2022
- IPC/EIA J-STD-003A
- IPC/EIA/JEDEC J-STD-002B
- EIA/JET-7401
Edge Dip Method Standards, including:
- IEC 60068-2-20 and 60068-2-58
- IPC/EIA/JEDEC J-STD-002B
- IPC/EIA J-STD-003A
Surface Insulation Resistance Testing System - AUTO-SIR - GEN3
Automated Precision Surface Insulation Resistance SIR Testing
SIR Testing to all current Standards, including:
- IEC 61189-5 (process characterisation)
- ISO 9455-17
- IPC-TM-650
- BELLCORE GR-78-CORE
- DIN GERMAN & JIS JAPANESE Standards
Auto- SIR Testing includes elements of:
- ANSI/IPC-JSTD001C (assembly requirements)
- IPC-JSTD-004 (solder flux characterisation)
- IPC-SM-840 (solder mask)
- IPC-CC-830 & IEC 1086 (conformal coatings)
Cleanliness Testing Systems - CM11 and CM 12 - GEN3
Contaminometer - Precision Cleanliness Test
ROSE - SEC Testing to current Standards, including: Thermal Shock Test Systems - Integrated Reliability Test Systems (IRTS)
- Providing accelerated thermal shock test systems and services to the PC board and electronic interconnect industries
- Highly Accelerated Thermal Shock (HATS) Test System
- -60c to =160c
- Transition time: 30seconds (-60c to =160c)
- Data acquisition using 4-wire resistance measurement with accuracy of 2% of value
- IPC PCQR/2 / D-36 committee adopted HATS test method to collect relative reliability data
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